[Xrays@aps.anl.gov] 2006 XSD Scientific Software Workshop User Survey

[Paul G. Evans]

Hi Pete,

We've been spending a fair amount of time working between the slices 
of reciprocal space acquired in CCD detectors and useful reciprocal 
space maps.  This is a problem that everyone using CCDs to do thin 
film diffraction faces, and something that I've seen limiting 
peoples' experiment.

Basically, the idea is that the stack of CCD images covers a volume 
of reciprocal space - which is really useful.  But the two axes of 
each image are often not particularly useful scientifically and the 
most useful maps have to be made by integrating across several 
images.  I'll find a picture of what I'm talking about.

A tool to integrate across several images in a general way would be fantastic.

Paul


At 07:20 AM 6/20/2006, you wrote:

>Dear Colleague:
>
>Please note that the date for responses to the
>user survey is Thursday, June 22.
>
>Regards,
>  2006 XSD Scientific Software Workshop Organizing Committee
>
>
>------------------% clip %--------------------------
>
>June 13, 2006
>
>Dear Colleague,
>
>We have been asked by the XSD Division to organize a workshop to
>determine our fundamental needs and opportunities in scientific
>software systems for x-ray data reduction, analysis, modeling and
>simulation.  The workshop has been scheduled for August 29, 2006
>at the Advanced Photon Source.
>
>In order to prepare for this workshop we would like your input on
>what you see as the needs and opportunities for scientific
>software development at the APS and in the X-ray community, as
>well as information that would support making a funding proposal
>for such resources.  In particular:
>
>1. What are the limitations of current tools for
>   x-ray data reduction, analysis, modeling, and simulation?
>
>2. What additional tools are needed?
>
>3. How can the existing tools be improved?
>
>4. What will most affect the scientific impact of your work?
>
>
>We realize you have a busy schedule and appreciate your taking
>time to address these issues.  We need the responses by
>Thursday, June 22. Please direct your responses to:
>
>    xrays at aps.anl.gov
>
>
>Thank you,
>
>  2006 XSD Scientific Software Workshop Organizing Committee
>       Kenneth Evans, Jr. <evans at aps.anl.gov>
>       Francesco De Carlo <decarlo at aps.anl.gov>
>       Pete Jemian <jemian at anl.gov>
>       Jonathan Lang <lang at aps.anl.gov>
>       Ulrich Lienert <lienert at aps.anl.gov>
>       John Maclean <jfm at aps.anl.gov>
>       Matt Newville <newville at cars.uchicago.edu>
>       Brian James Tieman <tieman at aps.anl.gov>
>       Brian H. Toby <toby at anl.gov>
>       Michel A. Van Veenendaal <michel at aps.anl.gov>
>
>_______________________________________________
>Xrays mailing list
>Xrays at mailman.aps.anl.gov
>http://www.aps.anl.gov/mailman/listinfo/xrays
>

---
Paul G. Evans
Department of Materials Science and Engineering
University of Wisconsin-Madison
227 Materials Science and Engineering Bldg.
1509 University Ave.
Madison, WI 53706
phone: (608) 265-6773
fax: (608) 262-8353
email: evans at engr.wisc.edu