Beamline 5-BM-D: Sector 5 - Bending Magnet D Branch Beamline

Description

The 5-BM-D beamline contains a dedicated extended x-ray absorption fine structure (EXAFS) setup, as well as a four-circle diffractometer. The rear of the enclosure is available for custom experimental setups, such as 2D diffraction with our detectors. This beamline is particularly well suited for in situ diffraction studies using high-energy x-rays. The high energies available can be used to probe the interiors of macroscopic samples. White beam and focused or unfocused pink beam are also available.

Supported Techniques

• X-ray absorption fine structure
• High-energy x-ray diffraction
• General diffraction

Beamline Controls and Data Acquisition

Linux running custom control code for motors and actuators on all systems. SPEC used to control diffractometers and surface science instruments  Vendor-supplied software used to control CCD detectors.

Detectors

• Spectroscopy-grade ionization chambers
• Lytle detector
• Scintillation detectors
• Mar 165 mm CCD detector
• EG&G Ortec Iglet solid-state detector
• Canberra 13-element SSD
• Microphotonics 2-D detector
• Bent Laue analyzers
• Vortex ME4 Silicon Drift Detector
• Lytle Electron Yield Accessory

Additional Equipment

• 4-circle diffractometer
• Capillary lens
• Outside air exhaust
• Displex cryostat (15K to 600K)
• Gas manifold for filling detectors

Local Contacts

Beamline Specs

For additional information see:
http://www.dnd.aps.anl.gov/