Beamline 2-ID-B: Intermediate Energy Branch Line

Description

Beamline 2-ID-B is devoted to nanometer-scale scanning and coherent diffractive imaging with 1-4 keV x-rays. Most applications are in the materials and environmental sciences, and take advantage of resonances (e.g. rare-earth M-edges, P and S K-edges) in this unique energy range.

Supported Techniques

• Coherent x-ray scattering (soft x-ray)
• Microfluorescence (soft x-ray)

Beamline Controls and Data Acquisition

2-ID-B is operated with EPICS-based applications running on Linux, Windows, and Mac workstations. A graphical user interface enables operation of the scanning instrument for users with little prior experience.

Detectors

• PIXIS-XO: 2K direct detection, Peltier CCD
• PI-MTE: 2K, direct detection, Peltier CCD
• PI 1K, direct detection, Peltier CCD
• VersArray: 2k, x-ray-to-vis detection, LN2 CCD
• SII Vortex EX-90: dispersive SDD
• EG&G LEGe: dispersive Ge
• 9-element differential phase contrast detector
• Absolute-calibrated and avalanche photodiodes

Additional Equipment

• Coherent diffraction x-ray microscope
• Coarse/fine scan stages (10 nm resolution)
• In-situ visible light microscope

Local Contacts

Beamline Specs