Beamline 20-BM-B: Sector 20 - Bending Magnet Beamline
X-ray Science Division, APS
Materials Science, Environmental Science, Chemistry
Description
General purpose x-ray spectroscopy beamline with multiple detection and sample environment capabilities. A toroidal focusing mirror is standard to 30 keV. Unfocused the energy range increases to 35 keV. Variable-angle harmonic-rejection mirror can also focus vertically to 30 micron. KB mirror focusing/x-ray microprobe can be set up upon request. A small 4-circle kappa geometry diffractometer is available.
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Supported Techniques
- X-ray absorption fine structure
- Microfluorescence (hard x-ray)
- micro X-ray absorption fine structure
- Diffraction anomalous fine structure
Beamline Controls and Data Acquisition
Windows XP with LabView, SPEC.
Detectors
- Ionization chambers
- 13-element and single-element Ge
- Pilatus 100K
- Vortex Si Drift
- NaI scintillation
- Si diodes
- Log spiral fluorescence detector
- Optical spectrometer
Additional Equipment
- 4-circle kappa geometry diffractometer
- Displex low temperature stage (20-300K)
- K-B mirror for 5 micron
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Local Contacts
Beamline Specs
Source |
Bending Magnet |
Monochromator Type |
Si(111) |
Energy Range |
2.7-25 keV |
Resolution (ΔE/E) |
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Flux (photons/sec) |
@10 keV |
Beam Size (HxV) |
  |
Focused |
5µm x 5µm
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Monochromator Type |
Si(111) |
Energy Range |
2.7-30 keV |
Resolution (ΔE/E) |
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Flux (photons/sec) |
@10 keV |
Beam Size (HxV) |
  |
Focused |
200µm x 500µm
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Monochromator Type |
Si(111) |
Energy Range |
2.7-35 keV |
Resolution (ΔE/E) |
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Flux (photons/sec) |
@10 keV |
Beam Size (HxV) |
  |
Focused |
10000µm x 30µm
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Unfocused |
10mm x 1mm
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For additional information see:
http://www.aps.anl.gov/Sectors/Sector20/
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