Beamline 4-ID-D: Magnetic Studies-Hard X-ray
X-ray Science Division, APS
Physics, Materials Science
Description
Beamline 4-ID-D focuses on polarization dependent spectroscopic and scattering studies of magnetic materials. This beamline is equipped with crystal phase retarding optics that allow the user to manipulate the polarization of the incoming x-ray beam on the sample (i.e., linear to circular [Pc = ±0.98] or horizontal linear to vertical linear [Plin = -0.80]).
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Supported Techniques
- Anomalous and resonant scattering (hard x-ray)
- Magnetic x-ray scattering
- Magnetic circular dichroism (x-ray magnetic circular dichroism, hard x-ray)
Beamline Controls and Data Acquisition
All data acquisition is done on Sun workstations (UNIX/Solaris) using the SPEC software program. Beamline control is done though EPICS-based applications running VME-based electronics. MEDM is used as a graphical interface to display and control various EPICS-based devices.
Detectors
- NaI scintillation (Oxford Cyberstar)
- Vortex Si drift diode detectors
- Pin diodes
- Ion chambers
- Avalanche Photodiodes
Additional Equipment
- 8-circle Huber diffractometer
- ARS He J-T stage Displex (1.4-325 K)
- ARS He Displex (4.5-325 K)
- ARS He Displex (50-800 K)
- He flow cryostat (3-325 K)
- Diamond anvil cells (spectroscopy and scattering)
- 4-tesla spectroscopy magnet; horizontal field
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Local Contacts
Beamline Specs
Source |
3.5 Undulator |
Monochromator Type |
Kohzu Si(111) |
Energy Range |
2.7-40 keV |
Resolution (ΔE/E) |
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Flux (photons/sec) |
@8 keV |
Beam Size (HxV) |
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Focused |
220µm x 100µm
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Unfocused |
2.6mm x 1.2mm
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For additional information see:
http://www.aps.anl.gov/Sector4/4idd/
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