Printable Version | View in New Window | Update Beamline Info

Beamline 2-BM-A,B: Sector 2 - Bending Magnet Beamline

X-ray Science Division, APS
Physics, Life Sciences, GeoScience, Materials Science

Description

The sector 2 bending magnet beamline is fully dedicated to microtomography.

Supported Techniques

Tomography

Phase contrast imaging

Beamline Controls and Data Acquisition

The beamline is run using Sun workstations (UNIX/Solaris). Beamline control is done though VME crates and EPICS. For diffraction experiments, data is taken using the SPEC. Some applications use the programs IDL & Igor.

Detectors

CCD/CMOS detectors
Scintillation detectors
Energy dispersive solid state detector

Additional Equipment

Fast x-ray tomography system
Micropositioning system

Local Contacts

Name	XIANGHUI XIAO (micro-Tomography, Fast Tomography, Laminography)
Phone	630.252.9621
Email	xhxiao@aps.anl.gov
Name	FRANCESCO DE CARLO (micro-Tomography)
Phone	630.252.0148
Email	decarlo@aps.anl.gov

Beamline Specs

Source	Bending Magnet
Monochromator Type	Multilayer monochromator
Energy Range	5-30 keV
Resolution (ΔE/E)	$1 x 10$ ^-2
Flux (photons/sec)	$1 x 10$ ¹² @17 keV
Beam Size (HxV)
Unfocused	25mm x 4mm
Monochromator Type	Pink Beam
Energy Range	10-30 keV
Flux (photons/sec)	$1 x 10$ ¹⁴ @ keV
Beam Size (HxV)
Unfocused	25mm x 4mm

For additional information see:
http://www.aps.anl.gov/Xray_Science_Division/Xray_Microscopy_and_Imaging/Beamlines/2_BM/

Current Status:	Operational/Accepting General Users
Access Mode:	On-site