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Beamline 33-ID-D,E: Sector 33 - Insertion Device Beamline

X-ray Science Division, APS
Materials Science, Physics, Chemistry, GeoScience, Environmental Science

Description

The facility provides advanced x-ray scattering and diffraction techniques to a diverse scientific community and supports advanced materials research as well as condensed matter physics. Primary usage encompasses surface and interface science, diffuse x-ray scattering, x-ray standing waves, and general scattering and diffraction applications. X-ray reflection interface microscopy (XRIM) is under development.  

 

Supported Techniques

  • Anomalous and resonant scattering (hard x-ray)
  • Diffuse x-ray scattering
  • General diffraction
  • Surface diffraction
  • Surface diffraction (UHV)
  • X-ray standing waves
  • X-ray reflectivity

Beamline Controls and Data Acquisition

UNIX/ Linux running EPICS with VME, SPEC.

Detectors

  • Scintillation counters
  • Ionization chambers
  • Pilatus 100K Area Detector
  • Vortex
  • CCD detectors (Roper)

Additional Equipment

  • Newport 6-circle goniometer w/ kappa geometry
  • X-ray standing waves platform
  • UHV surface/interface scattering chamber
  • X-ray reflection interface microscopy (XRIM)

Local Contacts

Name ZHAN ZHANG
Phone 630.252.0863
Name HAWOONG HONG
Phone 630.252.0864
Name CHRISTIAN M. SCHLEPUETZ
Phone 630.252.1292
Name JONATHAN TISCHLER
Phone 630.252.0861

Beamline Specs

Source

3.3 Undulator (Undulator A)

Monochromator Type

Si(111)

Energy Range

4-40 keV

Resolution (ΔE/E)

1 x 10 -4

Flux (photons/sec)

2 x 1013 @10 keV

Beam Size (HxV)

Focused

70µm x 30µm

Unfocused

2mm x 1.2mm

Monochromator Type

Diamond(111)

Energy Range

6-25 keV

Resolution (ΔE/E)

1 x 10 -4

Flux (photons/sec)

1 x 1013 @10 keV

Beam Size (HxV)

Focused

70µm x 30µm

Unfocused

2mm x 1.2mm

For additional information see:
http://www.aps.anl.gov/Sectors/33_34/

Current Status:

Operational/Accepting General Users

Access Mode:

On-site