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Beamline 11-ID-C: Sector 11 - High-energy Diffraction Beamline

X-ray Science Division, APS
Materials Science

Description

11-ID-C is a fixed high-energy beamline operating at 115 keV. It is used for diffraction measurements on both crystalline and amorphous materials using a 2D area detection primarily for structural studies or exploration of phase changes. A wide array of ancillary equipment may be used, in some cases in combination.

Supported Techniques

High-energy x-ray diffraction

Diffuse x-ray scattering

Pair distribution function

Beamline Controls and Data Acquisition

EPICS, SPEC

Detectors

Ionization chambers
Perkin Elmer amorphous silicon detector

Additional Equipment

High-energy diffractometer
Cryostream (80-400K)
Cryostat (10-700K)
Sample levitator
7 tesla cryomagnet

Local Contacts

Name	YANG REN (Structural studies of solids)
Phone	630.252.0363
Email	ren@aps.anl.gov
Name	CHRIS J. BENMORE (Liquids and glasses)
Phone	630.252.4207
Email	benmore@aps.anl.gov
Name	RICHARD SPENCE
Phone	630.252.2797
Email	spence@aps.anl.gov

Beamline Specs

Source (upstream)	2.3 Undulator
Source (downstream)	3.3 Undulator (Undulator A)
Monochromator Type	Laue Si(311) 1.8 deg fixed
Energy Range	115- keV
Resolution (ΔE/E)	$5 x 10$ ^-3
Flux (photons/sec)	$1 x 10$ ¹¹ @115 keV
Beam Size (HxV)
Unfocused	.2mm x .2mm

For additional information see:
http://www.aps.anl.gov/Xray_Science_Division/Structural_Science/

Current Status:	Operational/Accepting General Users
Access Mode:	On-site