Beamline 8-ID-E: GIXS, GISAXS, GIWAXS, and XPCS
X-ray Science Division, APS
Materials Science, Polymer Science, Physics
Description
8-ID-E is dedicated to the study of ordering and kinetics at surfaces and interfaces via the technique of grazing incidence x-ray-scattering (GIXS) in both small-angle (GISAXS) and wide-angle (GIWAXS) regimes. 8-ID-E also hosts programs to measure equilibrium dynamics via XPCS at large wave vector transfers and at liquid surfaces.
The GIXS set-up is optimized for high resolution in reciprocal space and provides a variety of time-resolved experiment capabilities such as temperature, solvent annealing and UV curing. X-rays are most often detected using a high speed version of the Pilatus 1M.
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Supported Techniques
- Grazing incidence small-angle scattering
- X-ray photon correlation spectroscopy
- Intensity fluctuation spectroscopy
- Grazing incidence diffraction
Beamline Controls and Data Acquisition
VME-based EPICS control system. SPEC (and medm) for experiment control and scripting. Matlab-based data reduction tools.
Detectors
- Pilatus 1MF
- PI LCX-1300 direct detection CCD
Additional Equipment
- Solvent annealing cells
- Variable temperature cells
- Vacuum environments
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Local Contacts
Beamline Specs
Source |
3.3 Undulator (Undulator A) |
Monochromator Type |
Si(220) |
Energy Range |
12-12 keV |
Resolution (ΔE/E) |
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Flux (photons/sec) |
@12 keV |
Beam Size (HxV) |
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Unfocused |
.8mm x .5mm
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Monochromator Type |
Si(111) |
Energy Range |
7.35-7.35 keV |
Resolution (ΔE/E) |
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Flux (photons/sec) |
@7.35 keV |
Beam Size (HxV) |
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Unfocused |
.8mm x .5mm
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For additional information see:
http://www.aps.anl.gov/Sectors/Sector8/
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