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Beamline 6-ID-B,C: Sector 6 - Main Branch Beamline

X-ray Science Division, APS
Physics, Materials Science

Description

6-ID-B,C is the main branch beamline on sector 6. It's primary focus is on magnetic x-ray scattering and general diffraction experiments using a Huber ψ-diffractometer located in the B experimental station. The B station also is equipped with a second diffractometer for scattering in applied magnetic fields (4 Tesla). The C station houses a UHV surface diffraction growth chamber, which is available on a collaborative basis (Univ. of Missouri and/or Georgia Tech).

Supported Techniques

Magnetic x-ray scattering

Anomalous and resonant scattering (hard x-ray)

General diffraction

Grazing incidence diffraction

Surface diffraction (UHV)

Beamline Controls and Data Acquisition

Sun UNIX workstations running Solaris OS. EPICS-based control system with VME electronics. SPEC data acquisition software.

Detectors

NaI detectors
Ionization chambers
Photodiodes
Mar345 imaging plate system

Additional Equipment

1.7K J-T Displex
4K Displex
High-temperature furnace for powder diffraction

Local Contacts

Name	PHILIP RYAN (Surface Diffraction)
Phone	630.252.0252
Email	ryan@aps.anl.gov
Name	JONG-WOO KIM (Magnetic Scattering)
Phone	630.252.0248
Email	jwkim@aps.anl.gov
Name	ZAHIRUL ISLAM (In-Field Scattering, Magnetic Scattering)
Phone	630.252.9252
Email	zahir@aps.anl.gov

Beamline Specs

Source	3.3 Undulator (Undulator A)
Monochromator Type	Si(111)
Energy Range	3.2-38 keV
Resolution (ΔE/E)	$1 x 10$ ^-4
Flux (photons/sec)	$7.1 x 10$ ¹² @8 keV
Beam Size (HxV)
Focused	1500µm x 150µm
Unfocused	1.5mm x .7mm

For additional information see:
http://www.aps.anl.gov/Sectors/Sector6/6idbc

Current Status:	Operational/Accepting General Users
Access Mode:	On-site