Beamline 2-ID-B: Intermediate Energy Fluorescence Microscopy

X-ray Science Division, APS
Materials Science, Environmental Science, Physics

Description

Beamline 2-ID-B is devoted to nanometer-scale X-ray fluorescence microscopy and spectroscopy with 635-2900 eV soft x-rays. Most applications are in the materials and environmental sciences, and take advantage of resonances (e.g. P and S K-edges) in this unique energy range.

 

Supported Techniques

  • Nano-fluorescence imaging
  • Differential phase contrast
  • Fluorescence spectroscopy

Beamline Controls and Data Acquisition

2-ID-B is operated with EPICS-based applications running on Linux, Windows, and Mac workstations. A graphical user interface enables operation of the scanning instrument for users with little prior experience.

Detectors

  • SII Vortex EX-90: dispersive SDD
  • 9-element differential phase contrast detector
  • Absolute-calibrated and avalanche photodiodes

Additional Equipment

  • Coarse/fine scan stages (10 nm resolution)
  • In-situ visible light microscope

Local Contacts

Name DAVID VINE
Phone 630.252.1984

Beamline Specs

Source

5.5 Undulator

Monochromator Type

ML spherical grating

Energy Range

635-2900 eV

Resolution (ΔE/E)

5 x 10 -4

Flux (photons/sec)

1 x 109 @2500 eV

Beam Size (HxV)

Focused

.04µm x .04µm

Unfocused

.35mm x .7mm

Current Status:

Operational/Accepting General Users

Access Mode:

On-site