Beamline 4-ID-D: Hard X-ray Magnetic Studies

X-ray Science Division, APS
Physics, Materials Science

Description

Beamline 4-ID-D focuses on polarization dependent spectroscopic and scattering studies of magnetic materials. This beamline is equipped with crystal phase retarding optics that allow the user to manipulate the polarization of the incoming x-ray beam on the sample (i.e., linear to circular (Pc ~ 0.98) or horizontal linear to vertical linear (Plin ~ -[0.80-0.95]).

 

Supported Techniques

  • Magnetic Circular Dichroism (hard x-ray)
  • Magnetic x-ray scattering

Beamline Controls and Data Acquisition

All data acquisition is done using LINUX workstations using the SPEC data acquisition software. All beamline control is done though EPICS-based applications running VME-based electronics. MEDM is used as a graphical interface to display and control these devices.

Detectors

  • NaI scintillation (Oxford Cyberstar)
  • Vortex Si drift diode detectors
  • Pin diodes
  • Ion chambers
  • Avalanche Photodiodes

Additional Equipment

  • 8-circle Huber diffractometer
  • ARS He J-T stage Displex (1.4-325 K)
  • ARS He Displex (4.5-325 K)
  • ARS He Displex (50-800 K)
  • He flow cryostat (3-325 K)
  • Diamond anvil cells (spectroscopy and scattering)
  • 4-tesla XMCD magnet (4.5-300 K); horizontal field
  • 6.5 T XMCD magnet, 1.5-300 K, 1 Mbar (horizontal field)

Local Contacts

Name DANIEL HASKEL (XMCD, Magnetic Reflectivity, High Pressure)
Phone 630.252.7758
Name YEJUN FENG (Magnetic Scattering, High-Pressure)
Phone 630.252.7780
Name YONGSEONG CHOI (Magnetic Reflectivity, XMCD)
Phone 630.252.2271

Beamline Specs

Source

3.5 Undulator

Monochromator Type

Kohzu Si(111)

Energy Range

2.7-40 keV

Resolution (ΔE/E)

1.4 x 10 -4

Flux (photons/sec)

3.5 x 1013 @8 keV

Beam Size (HxV)

Focused

220µm x 100µm

Unfocused

2.6mm x 1.2mm

For additional information see:
http://www.aps.anl.gov/Sectors/Sector4/4idd/

Current Status:

Operational/Accepting General Users

Access Mode:

On-site