Beamline 33-ID-D,E: Sector 33 - Insertion Device Beamline

X-ray Science Division, APS
Materials Science, Physics, Chemistry

Description

The facility provides advanced x-ray scattering and diffraction techniques to a diverse scientific community and supports advanced materials research as well as condensed matter physics. Primary usage encompasses surface and interface science, diffuse x-ray scattering, x-ray standing waves, and general scattering and diffraction applications.

Supported Techniques

Anomalous and resonant scattering (hard x-ray)

Diffuse x-ray scattering

General diffraction

Surface diffraction

X-ray reflectivity

X-ray standing waves

Beamline Controls and Data Acquisition

UNIX/ Linux running EPICS with VME, SPEC.

Detectors

Scintillation counters
Ionization chambers
Gas-filled proportional counters (Xe, Ar)
Vortex
CCD detectors
Pilatus 100K Area Detector

Additional Equipment

Newport 6-circle goniometer w/ kappa geometry
X-ray standing waves platform
UHV surface/interface scattering chamber

Local Contacts

Name	ZHAN ZHANG
Phone	630.252.0863
Email	zhanzhang@aps.anl.gov
Name	HAWOONG HONG
Phone	630.252.0864
Email	hhong@aps.anl.gov
Name	CHRISTIAN M. SCHLEPUETZ
Phone	630.252.1292
Email	cschlep@aps.anl.gov
Name	JONATHAN TISCHLER
Phone	630.252.0861
Email	tischlerjz@aps.anl.gov

Beamline Specs

Source	3.3 Undulator (Undulator A)
Monochromator Type	Si(111)
Energy Range	4-40 keV
Resolution (ΔE/E)	$1 x 10$ ^-4
Flux (photons/sec)	$2 x 10$ ¹³ @8 keV
Beam Size (HxV)
Focused	280µm x 100µm
Unfocused	2mm x .8mm
Monochromator Type	Diamond(111)
Energy Range	6-21 keV
Resolution (ΔE/E)	$1 x 10$ ^-4
Flux (photons/sec)	$1 x 10$ ¹³ @8 keV
Beam Size (HxV)
Unfocused	2mm x .8mm

For additional information see:
http://www.aps.anl.gov/Sectors/33_34/

Current Status:	Operational/Accepting General Users
Access Mode:	On-site