Beamline 11-ID-C: High-energy Diffraction Beamline

X-ray Science Division, APS
Materials Science, Chemistry, Physics

Description

11-ID-C is a fixed, high-energy beamline operating at 111.6 keV. It is used for diffraction measurements on both crystalline and amorphous materials using a 2D area detection primarily for structural studies or exploration of phase changes. A wide array of ancillary equipment may be used, in some cases in combination.

 

Supported Techniques

  • High-energy x-ray diffraction
  • Diffuse x-ray scattering
  • Pair distribution function

Beamline Controls and Data Acquisition

EPICS, SPEC
QXRD for data acquisition  

Detectors

  • Ionization chambers
  • Perkin Elmer amorphous silicon detector

Additional Equipment

  • High-energy diffractometer
  • Cryostream (80-400K)
  • Cryostat (10-700K)
  • Sample levitator
  • 7 tesla cryomagnet

Local Contacts

Name YANG REN (Structural studies of solids)
Phone 630.252.0363
Name OLAF J. BORKIEWICZ (PDF measurements and non-ambient diffraction measurements)
Phone 630.252.7957
Name RICHARD SPENCE
Phone 630.252.2797

Beamline Specs

Source (upstream)

3.3 Undulator (Undulator A)

Source (downstream)

2.3 Undulator

Monochromator Type

Laue Si(311) 1.8 deg fixed

Energy Range

111.6- keV

Resolution (ΔE/E)

5 x 10 -3

Flux (photons/sec)

1 x 1011 @111.6 keV

Beam Size (HxV)

Unfocused

.2mm x .2mm

For additional information see:
http://www.aps.anl.gov/Xray_Science_Division/Structural_Science/

Current Status:

Operational/Accepting General Users

Access Mode:

On-site