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Beamline 4-ID-C: Soft X-ray Magnetic Studies

X-ray Science Division, APS
Physics, Materials Science

Description

Beamline 4-ID-C focuses on polarization dependent soft x-ray spectroscopic studies, which probe the electronic and magnetic properties of a wide variety material systems. The x-ray source on this beamline is a unique electromagnetic undulator capable of delivering both vertical and horizontal linear as well as circular polarization over the spectral ranges given below:

  • Circular: 500 to 2800 eV (switchable at 0.5 Hz)
  • Linear Horizontal: 700 to 2800 eV
  • Linear Vertical: 700 to 2800 eV

 

Supported Techniques

  • Magnetic Circular Dichroism (soft x-ray)
  • X-ray magnetic linear dichroism
  • X-ray photoemission spectroscopy
  • X-ray photoemission electron microscopy
  • Anomalous and resonant scattering (soft x-ray)

Beamline Controls and Data Acquisition

EPICS-based control system with ScanSee data viewing software.

Detectors

  • Total electron yield
  • Total fluorescence yield (SII-Vortex)

Additional Equipment

  • High-Field Superconducting Magnet
    XAS and XMCD spectroscopy at 6.5 Tesla
  • Low-Field Electromagnet
    XAS and XMCD studies in 0.1 Tesla
  • X-PEEM
    Spatially-resolved (~100nm) magnetic imaging
  • XPS chamber
    Electronic structure at surfaces

Local Contacts

Name DAVID KEAVNEY (XMCD, X-PEEM)
Phone 630.252.7893
Name RICHARD A. ROSENBERG (XPS, XEOL)
Phone 630.252.6112
Name JOHN FREELAND (XMCD, XRMS)
Phone 630.252.9614

Beamline Specs

Source

Circularly Polarized Undulator

Monochromator Type

Spherical grating

Energy Range

500-2800 eV

Resolution (ΔE/E)

2 x 10 -4

Flux (photons/sec)

1.8 x 1012 @1350 eV

Beam Size (HxV)

Focused

300µm x 100µm

For additional information see:
http://www.aps.anl.gov/Sectors/Sector4/4idc

Current Status:

Operational/Accepting General Users

Access Mode:

On-site