Beamline 34-ID-C: Microdiffraction, Coherent X-ray Scattering
X-ray Science Division, APS
Materials Science, Physics
Description
At the station C, the facility provides coherent x-ray scattering technique to a diverse scientific community. The experiments exploit the APS source brilliance to study fundamental materials structures using dedicated coherent x-ray scattering microscopy.
At the station E, the facility provides microbeam diffraction technique to a diverse scientific community. The experiments exploit the APS source brilliance to study fundamental materials structures and deformation processes using dedicated x-ray microbeam diffraction microscopy.
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Supported Techniques
- Coherent x-ray scattering
Beamline Controls and Data Acquisition
UNIX/Linux running EPICS with VME, SPEC.
Detectors
- CCD camera
- Scintillation counters
- Ionization chambers
Additional Equipment
- Kappa diffractometer (34-ID-C)
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Local Contacts
Beamline Specs
Source |
3.3 Undulator (Undulator A) |
Monochromator Type |
Si(111) - E station |
Energy Range |
7-25 keV |
Resolution (ΔE/E) |
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Flux (photons/sec) |
@ keV |
Beam Size (HxV) |
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Focused |
.3µm x .25µm
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Monochromator Type |
White Beam - E station |
Energy Range |
7-25 keV |
Flux (photons/sec) |
@ keV |
Beam Size (HxV) |
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Focused |
.3µm x .25µm
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Monochromator Type |
Si(111) - C station |
Energy Range |
5-15 keV |
Resolution (ΔE/E) |
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Flux (photons/sec) |
@ keV |
Beam Size (HxV) |
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Focused |
1µm x 1.5µm
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Unfocused |
.1mm x .1mm
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For additional information see:
http://www.uni.aps.anl.gov
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