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Beamline 34-ID-E: Microdiffraction

X-ray Science Division, APS
Materials Science, Physics

Description

The facility provides microbeam diffraction technique to a diverse scientific community. The experiments exploit the APS source brilliance to study fundamental materials structures and deformation processes using dedicated 3D x-ray microbeam diffraction microscopy.

Supported Techniques

Microdiffraction

Laue crystallography

Microbeam

Beamline Controls and Data Acquisition

UNIX/Linux running EPICS with VME. Custom data collection and analysis software for 3D diffraction microscopy

Detectors

Amorphous Si area detectors (Perkin-Elmer)
KETEK GmbH AXAS Si drift detector
Ionization chambers
Roper Scientific PI�SCX:4300 CCD

Local Contacts

Name	WENJUN LIU
Phone	630.252.0890
Email	wjliu@anl.gov
Name	RUQING XU
Phone	630.252.0858
Email	ruqingxu@anl.gov
Name	JONATHAN TISCHLER
Phone	630.252.0861
Email	tischlerjz@aps.anl.gov

Beamline Specs

Source	3.3 Undulator (Undulator A)
Monochromator Type	Si(111)
Energy Range	7-30 keV
Resolution (ΔE/E)	$1 x 10$ ^-4
Flux (photons/sec)	$1 x 10$ ⁹ @ keV
Beam Size (HxV)
Focused	.3µm x .3µm
Monochromator Type	White Beam
Energy Range	7-30 keV
Flux (photons/sec)	$4 x 10$ ¹¹ @ keV
Beam Size (HxV)
Focused	.3µm x .3µm

For additional information see:
http://www.uni.aps.anl.gov

Current Status:	Operational/Accepting General Users
Access Mode:	On-site