Beamline 11-ID-C: Sector 11 - High-energy Diffraction Beamline
X-ray Science Division, APS
Materials Science
Description
11-ID-C is a fixed high-energy beamline operating at 115 keV. It is used for diffraction measurements on both crystalline and amorphous materials using a 2D area detection primarily for structural studies or exploration of phase changes. A wide array of ancillary equipment may be used, in some cases in combination.
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Supported Techniques
- High-energy x-ray diffraction
- Diffuse x-ray scattering
- Pair distribution function
Beamline Controls and Data Acquisition
EPICS, SPEC
Detectors
- Ionization chambers
- Perkin Elmer amorphous silicon detector
Additional Equipment
- High-energy diffractometer
- Cryostream (80-400K)
- Cryostat (10-700K)
- Sample levitator
- 7 tesla cryomagnet
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Local Contacts
Beamline Specs
Source (upstream) |
2.3 Undulator |
Source (downstream) |
3.3 Undulator (Undulator A) |
Monochromator Type |
Laue Si(311) 1.8 deg fixed |
Energy Range |
115- keV |
Resolution (ΔE/E) |
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Flux (photons/sec) |
@115 keV |
Beam Size (HxV) |
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Unfocused |
.2mm x .2mm
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For additional information see:
http://www.aps.anl.gov/Xray_Science_Division/Structural_Science/
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