Michael Wieczorek
Crystal Optics Fabrication Specialist
Optics
X-ray Science Division
Argonne National Laboratory
9700 S. Cass Ave
Building 401-B3195
(630) 252-6794 • email
Biography
ARGONNE NATIONAL LABORATORY, (2004 to Present), Crystal Optics Fabrication Specialist
MOTOROLA / AUTOMOTIVE DIV., (2003 to 2004), Technical Process Specialist
MOLEX, INC., (2001 to 2003), Process Engineer
NANOVATION TECHNOLOGIES, INC., (2000 to 2001), Process Engineer
NORTHWESTERN UNIVERSITY / BIRL, (1987 to 2000), Lead Materials Research Technician
GOULD, INC., (1985 to 1987), Research Assistant
ABBOTT LABORATORIES INC., (1982 to 1985), Process Technician
Selected Publications
Michael Wieczorek, Ruben Khachatryan, Yuri Shvyd’ko, Robert H. Smith, Kenichi Iwasaki, Suzanne Miller, Jun Qian, Xianrong Huang, and Lahsen Assoufid. Achieving Optimal Flatness and Surface Roughness Properties for Novel X-ray Optic Structures Formed by Dicing Saws. SPIE 8502, Advances in X-Ray/EUV Optics and Components VII, 85020M (October 15, 2012); doi: 10.1117/12.928369.
Michael Wieczorek, Xianrong Huang, Jozef Maj, Ray Conley, Jun Qian, Albert Macrander, Cynthia Christensen, John Hodsden, and Ruben Khachatryan, “Assessing the quality of x-ray optic surfaces of Si crystals cut by diamond-wire and rotating-blade sawing techniques”, Advances In X-ray Analysis, Vol. 52, Proceedings of the 57th Annual Conference on Applications of X-ray Analysis [Denver X-ray Conference] and the 8th International Conference on Residual Stresses (ICRS-8), August, 2008.
H.C. Kang, G. B. Stephenson, C. Liu, R. Conley, R, Khachatryan, M. Wieczorek, A.T. Macrander, H. Yan, J. Maser, J. Hiller, and R. Koritala, "Sectioning of multilayers to make a multilayer Laue lens", Rev. Sci. Instrum., April, 2007.
Chian Liu, G. E. Ice, W. Liu, L. Assoufid, J. Qian, B. Shi, R. Khachatryan, M. Wieczorek, P. Zschack, and J. Z. Tischler, “Fabrication of nested elliptical KB mirrors using profile coating for synchrotron radiation x-ray focusing”, 18th International Vacuum Congress, Beijing, August, 2010.
Michael Wieczorek, Ruben Khachatryan, Yuri Shvyd’ko, Robert H. Smith, Kenichi Iwasaki, Suzanne Miller, Jun Qian, Xianrong Huang, and Lahsen Assoufid. Achieving optimal flatness and surface roughness properties for novel x-ray optic structures formed by dicing saws, Proceedings of SPIE (Advances in X-Ray/EUV Optics and Components VII), vol. 8502, September 27, 2012.
Bing Shi, Jon M. Hiller, Yuzi Liu, Chian Liu, Jun Qian, Lisa Gades, Michael J. Wieczorek, Albert T. Macrander, Jorg Maser, and Lahsen Assoufid. A unique approach to accurately measure thickness in thick multilayers, The Journal of Synchrotron Radiation, (2012), 19, 425-427.
Yu. V. Shvyd’ko, J. P. Hill, C. A. Burns, D. S. Coburn, B. Brajuskovic, D. Casa, K. Goetze, T. Gog, R. Khachatryan, J.-H. Kim, C. N. Kodituwakku, M. Ramanathan, T. Roberts, A. Said, H. Sinn, D. Shu, S. Stoupin, M. Upton, M. Wieczorek, H. Yavasa. MERIX - next generation medium energy resolution inelastic x-ray scattering instrument at the APS, Journal of Electron Spectroscopy and Related Phenomena, accepted for publication September 10, 2012.
Research Interests
X-ray optic fabrication, sensor and microelectronic device fabrication, and materials analysis.
Education
B.S., University of Phoenix
A.S., Wilbur Wright College
Industrial Electronics Certificate, Coyne Institute
Experience
30 years of experience in R&D working for government, industry, and academic institutions. Fabrication of sensor and microelectronic devices and x-ray optics. Managed a materials analysis facility including operation, maintenance and repair of all analytical equipment.
Awards and Honors
Motorola Six Sigma Green Belt, January, 2004.
Argonne Quality and Safety Recognition Award, December, 2008.